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Webinar: Testing of MEMS Inertial Sensors by Utilizing IEEE 2700 Standard for Sensor Performance
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Testing of MEMS Inertial Sensors by Utilizing IEEE 2700 Standard for Sensor Performance Parameter Definitions

When: 6/18/2015
11:30 AM

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In 2012, representatives from Intel Corp and Qualcomm Technologies, Inc. started work on a document to establish an industry standard minimum set of MEMS performance parameters, “Standardized Sensor Performance Parameter Definitions”. This work was supported and championed by the MEMS Industry Group (MIG), which is the trade association advancing MEMS and sensors across global markets, and by the National Institute of Standards and Technology (NIST). A revised version, with the contributions from the rest of the MEMS industry, was officially released as IEEE 2700 Standard for Sensor Performance Parameter Definitions by the IEEE Standards Association. 

ACUTRONIC USA Inc. has applied methodology described in the Standard to conduct comparison testing between commercially available MEMS inertial sensors. In its Inertial Test Solutions (iTS) Lab, located in Pittsburgh, PA, ACUTRONIC has performed testing, conducted an analysis and prepared a comparative report on commercial grade 3-axis gyroscopes from ST Microelectronics, InvenSense and Bosch Sensortec. This presentation describes test setup, test definitions, standards interpretation and actual testing of the 3-axis gyros. The presentation concludes with results comparison between the 3-axis gyros. Comparative testing of the inertial and other MEMS sensors, performed under IEEE 2700 guidelines can greatly improve selection process for choosing which types of MEMS sensors best fit for a specific device. Based on the results of the testing under the IEEE 2700 standard we recommend the MEMS industry start or expand the use of IEEE 2700 standard for comparative testing and component selection across the spectrum of products and devices. ACUTRONIC’s iTS Lab enables such testing for all types of inertial MEMS sensors.


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