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Webinar: Intro to MEMS Reliability – How to Fix Problems Before they Happen
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3/31/2016
When: 3/31/2016
11:30 am
Presenter: Allyson Hartzell, Veryst Engineering

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Systems and networks with multiple MEMS devices such as the Internet of Things, Wearables, and Automotive Technologies (as examples) require close to zero failure rates for acceptable system reliability in the consumer’s use environments. MEMS technologies require attention to reliability in the design phase, with studies for reliability starting early in the product cycle and lasting throughout product development. This Introduction to MEMS Reliability webinar will cover the following topics: failure mechanisms in MEMS, lifetime predictive methodologies, acceleration factor development, and statistical distributions for reliability data.  Examples of design and process fixes, examples of distributions for reliability data, and case studies of non-standard MEMS reliability predictions will be reviewed. Simulations of MEMS, packaging, and systems will also be covered. This webinar will provide guidance to the MEMS user and/or designer, with advice and how to fix problems before they happen, as well as how to fit data properly. If you want an inside view on MEMS reliability, this webinar is not to be missed.


Ms. Allyson Hartzell is a Managing Engineer at Veryst Engineering with more than three decades of professional experience in emerging technologies. She is an internationally recognized expert in MEMS reliability and has expertise in surface chemistry and analytical techniques for failure analysis.  Ms. Hartzell possesses a broad background in semiconductor and MEMS fabrication, yield enhancement, emerging technology manufacturing and reliability, packaging materials and processing, and cleanroom science—including particulate and molecular contamination.  She works with customers on reliability, failure analysis root cause and corrective action, manufacturing problem solving and fundamental materials science.  Allyson co-authored the Springer MEMS Reference Shelf Series book MEMS RELIABILITY, edited by Prof. Steve Senturia, Prof. Roger Howe and Dr. Tony Ricco. Ms. Hartzell has an M.S. degree in Applied Physics from Harvard University and a B.S. degree in Materials Engineering from Brown University.

 

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