Thanks to all of you who attended the MEMS Testing Standards Workshop and M2M Forum® 2011 (Strategies for Reducing the Cost of MEMS Test). Conference materials, presentations, and working group notes are now available in the MIG Resource Library for MIG members only. Please click here to access these materials and search for "mems test." For a full list of presentation and conference materials, please click here.
Check out photos from the event below.
MIG would like to thank its volunteer steering committee for its insight and hard work.
|Roc Blumenthal, SVTC||Prakash Krishan, SVTC||Sascha Revel, Acutronic|
|Ed Brachocki, Kionix||Eric Lautenschlager, Knowles||Magnus Rimskog, Silex Microsystems|
|Harry Engwer, Semiconductor Support Services||Pinyen Lin||Dominique Schinabeck, Acutronic|
|Michael Gaitan, NIST||Mike Mignardi, Texas Instruments||Harry Stephanou, ARRI|
|Nicole Kerness, Maxim||Christopher Milne, Honeywell||Carolyn White, AM Fitzgerald & Associates|
|Jim Knutti, Acuity Incorporated||Harvey Nathanson, Northrop Grumman|
Please refer to MIG's antitrust policy.